Table of Content




1. Executive Summary


2. Global Failure Analysis Market : Market Dynamics
2.1: Introduction, Background, and Classifications
2.2: Supply Chain
2.3: Industry Drivers and Challenges 


3. Market Trends and Forecast Analysis from 2018 to 2030
3.1. Macroeconomic Trends (2018-2023) and Forecast (2024-2030)
3.2. Global Failure Analysis Market Trends (2018-2023) and Forecast (2024-2030)

3.3: Global Failure Analysis Market by Equipment
3.3.1: Optical Microscope
3.3.2: Scanning Electron Microscope (SEM)
3.3.3: Transmission Electron Microscope (TEM)
3.3.4: Scanning Probe Microscope
3.3.5: Focused Ion Beam System (FIB)
3.3.6: Dual-Beam System (FIB-SEM)
3.3.7: Others


3.4: Global Failure Analysis Market by Technology
3.4.1: Energy Dispersive X-Ray Spectroscopy (EDX)
3.4.2: Secondary Ion Mass Spectrometry (SIMS)
3.4.3: Focused Ion Beam (FIB)
3.4.4: Broad Ion Milling (BIM)
3.4.5: Relative Ion Etching (RIE)
3.4.6: Scanning Probe Microscopy (SPM)
3.4.7: Others


3.5: Global Failure Analysis Market by Application
3.5.1: Electronics & Semiconductor
3.5.2: Industrial Science
3.5.3: Material Science
3.5.4: Bioscience
3.5.5: Others





4. Market Trends and Forecast Analysis by Region from 2018 to 2030
4.1: Global Failure Analysis Market by Region
4.2: North American Failure Analysis Market
4.2.1: North American Failure Analysis Market by Equipment: Optical Microscope, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Probe Microscope, Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), and Others
4.2.2: North American Failure Analysis Market by Application: Electronics & Semiconductor, Industrial Science, Material Science, Bioscience, and Others

4.3: European Failure Analysis Market
4.3.1: European Failure Analysis Market by Equipment: Optical Microscope, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Probe Microscope, Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), and Others
4.3.2: European Failure Analysis Market by Application: Electronics & Semiconductor, Industrial Science, Material Science, Bioscience, and Others

4.4: APAC Failure Analysis Market
4.4.1: APAC Failure Analysis Market by Equipment: Optical Microscope, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Probe Microscope, Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), and Others
4.4.2: APAC Failure Analysis Market by Application: Electronics & Semiconductor, Industrial Science, Material Science, Bioscience, and Others

4.5: ROW Failure Analysis Market
4.5.1: ROW Failure Analysis Market by Equipment: Optical Microscope, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Scanning Probe Microscope, Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), and Others
4.5.2: ROW Failure Analysis Market by Application: Electronics & Semiconductor, Industrial Science, Material Science, Bioscience, and Others


5. Competitor Analysis
5.1: Product Portfolio Analysis
5.2: Operational Integration
5.3: Porter’s Five Forces Analysis


6. Growth Opportunities and Strategic Analysis
6.1: Growth Opportunity Analysis
6.1.1: Growth Opportunities for the Global Failure Analysis Market by Equipment
6.1.2: Growth Opportunities for the Global Failure Analysis Market by Technology
6.1.3: Growth Opportunities for the Global Failure Analysis Market by Application
6.1.4: Growth Opportunities for the Global Failure Analysis Market by Region

6.2: Emerging Trends in the Global Failure Analysis Market

6.3: Strategic Analysis
6.3.1: New Product Development
6.3.2: Capacity Expansion of the Global Failure Analysis Market
6.3.3: Mergers, Acquisitions, and Joint Ventures in the Global Failure Analysis Market
6.3.4: Certification and Licensing


7. Company Profiles of Leading Players
7.1: A&D
7.2: Bruker
7.3: Carl Zeiss
7.4: Hitachi High-Technologies
7.5: Horiba
7.6: Intertek
7.7: JEOL
7.8: Motion X
7.9: Tescan Orsay Holding
7.10: Thermo Fisher Scientific