Table of Content

Part 1. Summary
Part 2. Introduction
? Study period
? Geographical scope
? Market segmentation
Part 3. Failure analysis market overview
Part 4. Market breakdown by product
? Scanning electron microscope (SEM)
? Focused ion beam (FIB) system
? Transmission electron microscope (TEM)
? Dual beam system
Part 5. Market breakdown by end user
? Automotive
? Construction
? Manufacturing
? Military
? Oil and gas
? Others
Part 6. Market breakdown by region
? North America
? Europe
? Asia-Pacific
? MEA (Middle East and Africa)
? Latin America
Part 7. Key companies
? A&D Company Ltd.
? Bruker Corporation
? Carl Zeiss SMT GmbH
? Hitachi High-Tech Corporation
? Horiba Ltd.
? Intertek Group plc
? JEOL Ltd.
? Motion X Corporation
? TESCAN ORSAY HOLDING, a.s.
? Thermo Fisher Scientific Inc. (FEI Company)
Part 8. Methodology