The Key Players Global Electron Beam (e-Beam) Wafer Inspection System Market 2015-2019, According to a New Study on ASDReports

Monday 14 December 2015, Amsterdam

The report, now available on ASDReports, recognizes the following companies as the key players in the Global Electron Beam (e-Beam) Wafer Inspection System Market: Applied Materials, ASML, Hermes Microvision, Hitachi High-Technologies, KLA-Tencor and Lam Research

Commenting on the report, an analyst said: “Research engineers have developed a new type of e-beam wafer inspection system known as the multi-beam e-beam system, which operates at a higher throughput of the inspection tool. The market is also observing the increase in semiconductor content in automotive products, which will increase the demand for semiconductor wafers. One other noticeable trend is the increase in R&D spending by vendors and the YoY increase in average selling price of e-beam wafer inspection equipment systems.”

According to the report, the demand for e-beam wafer inspection systems will mainly grow as a result of the increasing demand for semiconductor wafers in many segments, such as consumer electronics, telecommunication, and automotive. The growing complexity of the design of wafers, which leads to increase in the density of defects, will also increase the demand in the market.

Further, the report states that the high operation cost of e-beam wafer inspection systems is slowing the adoption of the e-beam system by the semiconductor foundries. The inability of the system to differentiate between defect and nuisance is another challenge faced by the vendors.

The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.